`TM 11-6625-539-14-4
EL6625-539-14-4-TM-10
Figure 5-7. I
co, IRfunction test circuit, simplified schematic diagram.
drive the device under test with an ac signal that
jacks, more current will flow when the function is
is free of dc component due to capacitor C8. If the
forward-biased and a resulting dc component will
be generated. The meter amplifier AR4 will force
CE jacks are connected only to a resistive device,
the signal at R36 will remain purely ac. Meter
amplifier AR4 is a dc amplifier in this configura-
dc component. If the diode (PN junction) is open
tion, and no meter current will flow when an ac
or shorted, no dc component will be generated.
singal is applied.
The meter will remain at zero and will not deflect
b. If a P-N junction is placed across the C-E
into the GOOD range.
Figure 5-8. Diode in-circuit function test circuit, simplified schematic diagram.