TM 11-6625- 539- 14-4
INTRODUCTION
Section I. GENERAL
1-1. Scope
Equipment. Maintenance forms, records, and
re-ports which are to be used by maintenance
a.
This manual describes Test Set, Transistor
personnel at all maintenance levels are listed
TS- 1836D/U (test set) (fig. ll) and provides in-
in and prescribed by DA Pam 750-8.
structions for operation, cleaning, troubleshooting,
b. Report of Packaging and Handling
testing, aligning, and repairing the equipment. It also
Deficiencies. Fill out and forward DD Form 6
lists tools, materials, and test equipment required for
(Packaging
Improvement
Report)
as
organizational and general sup-port maintenance. No
prescribed in AR 735-11 -2/NAVSUP PUB
direct support maintenance is authorized for the
378/AFR 71-4/MCO P4030.29, and DSAR
equipment.
4145.8.
b. A list of references is contained in appendix A.
c. Discrepancy in Shipment Report
c. The maintenance allocation chart (MAC) ap-
(DISREP) (SF 361). Fill out and forward
pears in appendix C.
Discrepancy in Shipment Report (DISREP)
(SF 361) as prescribed in DA Pam 25-
d. Appendix D contains test data for transistors
30/NAVSUPINST 4610.33/AFM 7518/ MCO
and diodes, the testing of which is within the
P4610.19A, and DSAR 4500.15.
capability of this test set. Refer to this appendix to
determine whether test indications are within the
listed requirements for the device under test. The
1-4. Reporting of Errors
appendix is divided into separate sections for bipolar
transistors, field effect transistors, and diodes and
Report
of
errors,
omissions,
and
rectifiers. A separate section contains transistors
recommendations
for
improving
this
basing data which helps to identify the terminals of
publication is authorized and encouraged.
devices to be tested.
Reports should be submitted on DA Form
2028 (Recommended Changes to Publi-
1-2. Indexes of Publications
cations and Blank Forms) and forwarded
a. DA PAM 25-30 . Refer to the latest issue of DA
direct to Commander, US Army Aviation and
Missile Command, ATTN: AMSAM-MMC- MA-
Pam 25- 30 to determine whether there are new
NM, Redstone Arsenal, AL. 35898- 5000.
editions, changes, or additional publications pertaining
to the equipment.
1-5. Administrative Storage
b. DA Pam 25-30 . Refer to DA Pam 25-30 to
determine whether there are modification work orders
For procedures, forms, and records, and
(MWO's) pertaining to the equipment.
inspections required during administrative
storage of this equipment, refer to chapter 2.
a. Reports of Maintenance and Unsatisfactory
1-6. Destruction of Army Materiel
Demolition and destruction of electronic
equipment will be under the direction of the
commander and in accordance with TM 750-
244-2.
Section Il. DESCRIPTION AND DATA
supply. It is designed to test transistors and
diodes either in circuit or out of circuit. The
Test Set, Transistor TS- 1836D/U is a portable test set
required type of test is selected by a function
powered by a self-contained battery power
Change 2
