TM 11-6625-539-14-3
e. 1 CO (Out-of-Circuit).
i. Field Effect Transistors GM (Out-of-Cir-
(1) Set the polarity switch to correspond
cuit).
to the type of semiconductor device being tested.
(1) If a field effect transistor with short
(2) Place the transistor in the socket on
leads is being measured, place the transistor in
the lower right corner of the front panel.
the small socket on the lower right side of the
(3) Set the function switch to ICO OUT/
front panel. Place the drain lead in pin C, the
CKT X1.
gate lead in pin B, and the source lead in pin E.
(4) Read the l CO directly in microampere
The transistor jacks on the front panel are spaced
on the center (ICO) scale,
so that they will accept a standard test adapter
(5) If the meter pointer moves off-scale, set
for rapid testing of transistors with long leads.
the function switch to ICO OUT/CKT X10.
( 2 ) Set the polarity switch to FWD PNP
(6) Multiply the ICO reading in microampere
when testing a P-type transistor, and to REV
by 10 to obtain the true ICO reading.
NON when testing an N-type transistor,
(3) Set the function switch to F. E. T. CAL,
f. Diodes in Circuit.
and adjust the CAL control for full-scale meter
(1) Set the polarity switch to FWD PNP.
deflection.
(2) Connect the cathode of the diode to the
( 4 ) Set the function switch to F. E. T.
red lead of the test cable; connect the anode of
READ, and read the GM of the transistor under
the diode to the yellow lead.
test directly on the meter on the bottom (GM )
(3) Set the function switch to CAL DIODE
scale.
IN/CKT.
j. Field Effect Transistors G M (In-Circuit).
(4) Increase the CAL control until an up-
(1) Insert the three test leads supplied with
ward deflection is visible on the meter. If an up-
the instrument into the three color-coded jacks
ward deflection is obtained on the meter, the
on the front panel; be careful to insert the red
diode is neither open nor shorted. If there is no
probe into the red jack, the black probe into the
deflection, the diode is either open or shorted or
black jack, and the yellow probe into the yellow
jack. Connect the other ends of the test leads to
g, Diodes IR (Out-of-Circuit).
the transistor under test. Be careful to connect
(1) Set the polarity switch to FWD PNP.
the red-coded alligator clip to the drain lead, the
(2) Connect the cathode of the diode to the
black-coded alligator clip to the gate lead, and
red lead of the test cable; connect the anode of
the yellow-coded alligator clip to the source lead
the diode to the black lead.
of the field effect transistor.
(3) Set the function switch to ICO OUT/
( 2 ) Set the polarity switch to FWD PNP
CKT X1.
when testing a P-type transistor, and set it to
(4) Read the I R directly in microampere
REV NPN when testing an N-type transistor.
on the middle (ICO) scale.
(3) Set the function switch to F. E. T. CAL,
(5) If the meter pointer swings off-scale,
and adjust the CAL control for full-scale meter
deflection.
place the function switch in the ICO OUT/CKT
( 4 ) Set the function switch to F. E. T.
X10 range.
READ, and read the GM of the transistor under
(6) Multiply the IR reading in microampere
test directly on the meter on the bottom (GM)
by 10 to obtain the true IR reading.
scale.
h. Diodes, Reverse-to-Forward Ratio (Out-of-
k. Battery Check.
(1) Set the function switch to BAT.
Circuit).
(2) The meter pointer should fall in the red
(1) Set the polarity switch to FWD PNP.
box on the top scale labeled BAT. If the meter
(2) Connect the cathode of the diode to the
pointer falls outside this box, the batteries should
red lead of the test cable; connect the anode of the
be replaced.
diode to the yellow lead.
(3) Set the function switch to DIODE 1-10,
and adjust the CAL control for full-scale meter
3-5. Methods for Servicing Semiconductor
deflection.
(4) Set the polarity switch to REV NON,
Test Set, -Transistor TS1836C/U is designed so
and read the diode ratio (with a reference to 1 )
that it is a safe instrument to use with semi-
directly on the BETA (top) scale.
c o n d u c t o r circuitry. T h e voltage and current